Correlates and prognostic value of left atrial strain in transcatheter edge-to-edge repair for degenerative mitral regurgitation
European Heart Journal - Cardiovascular Imaging

Abstract
Data are scarce regarding the implications of left atrial (LA) strain (LAS) in patients undergoing transcatheter edge-to-edge repair (TEER) for degenerative mitral regurgitation (MR). We explored pre-, intra-, and post-procedural aspects according to LAS status in this setting.
A single-centre, retrospective analysis was performed that included 367 individuals (median age 82 years, 62.4% male) referred to isolated, first-time interventions. Stratified by median LAS at baseline (18.5%) and at 1-month post-procedure (29.0%), the cohort was evaluated for all-cause mortality, heart failure (HF) hospitalizations, and significant MR and/or functional incapacitation persistence during the first post-interventional year. Subjects with below-median preprocedural LAS presented more often with acute HF and/or haemodynamic instability, displayed higher interventional risk and atrial fibrillation/flutter prevalence, and had more pronounced chamber dysfunction/dilatation. Procedural features were unaffected by baseline LAS allocation, leading to >97% technical success rate and >80% freedom from above-moderate MR or New York Heart Association Class III–IV in both groups. Worse baseline LAS was associated with higher rates, cumulative incidences, and risks of deaths and/or HF hospitalizations. Per exploratory analysis, the excess composite risk (hazard ratio 2.16, 95% confidence interval 1.16–4.00,
Although unrelated to procedural feasibility, safety, or efficacy, worse LAS identifies higher-risk patients prone to experience a less favourable clinical course post-TEER for degenerative MR.
Contributors

Homa Taheri
Author

Danon Kaewkes
Author

Takashi Nagasaka
Author

Kazuki Suruga
Author

Aakriti Gupta
Author

Vivek Patel
Author

Ofir Koren
Author

Keita Koseki
Author

Sabah Skaf
Author

Moody Makar
Author

Dhairya Patel
Author

Tarun Chakravarty
Author

Robert J Siegel
Author

