Prognostic value of CT-derived biatrial strain in predicting recurrence after atrial fibrillation ablation
31 August 2026 (10:15 - 11:00)
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Abstract
About the speaker

Ehime University, Toon (Japan)
5 More presentations in this session
Doctor R. Barbosa Sousa (Lisbon, PT)
Professor L. Zhong (Singapore, SG)
Professor D. Aronson (Haifa, IL)
Doctor J. Minners (Bad Krozingen, DE)
Doctor D. Hochstein (Ramat Gan, IL)
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The Event
ESC Congress 2026
31 August 2026
10:15 CET
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