ESC 365 - Abandoning leads: do you think about the future risk of infection?

EHRA Premium Access

Abandoning leads: do you think about the future risk of infection?

Session: Can lead extraction decrease future device infection rates?

Topic: Device Complications and Lead Extraction

Speaker: Doctor E. Nof (Ramat Gan, IL)

Sponsored by Philips

Event: EHRA 2019

Congress Presentation

Add to my library

About the speaker

Doctor Eyal Nof

Sheba Medical Center, Ramat Gan (Israel)

4 presentations

0 follower

4 more presentations in this session

Introduction - Can lead extraction decrease future device infection rates?

Speaker: Associate Professor C. Kennergren (Gothenburg, SE) Professor B. Wilkoff (Cleveland, US)

Infected patients: worse outcomes?

Speaker: Associate Professor S. Hakmi (Hamburg, DE)

Lead extraction in experienced hands is a safe and successful procedure.

Speaker: Doctor P. Mazzone (Milan, IT)

Concluding remarks - Can lead extraction decrease future device infection rates?

Speaker: Associate Professor C. Kennergren (Gothenburg, SE) Professor B. Wilkoff (Cleveland, US)

Access the full session

Can lead extraction decrease future device infection rates?

Speakers: Doctor E. Nof, Associate Professor C. Kennergren, Professor B. Wilkoff, Associate Professor S. Hakmi, Doctor P. Mazzone...

About the event

EHRA 2019

17 March - 19 March 2019

Sessions Presentations

Congress

ESC 365 is supported by

Explore sponsored resources

Explore sponsored resources