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Burden of device-detected atrial high-rate episode is associated with heart failure events

28 August 2018 (08:30 - 12:30)
Organised by:
Congress Presentation Part of: Poster Session 6 - Atrial fibrillation - ablation Invasive Diagnostic Methods ESC Premium Access ESC Congress 2018

About the speaker

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Doctor Ryo Nishinarita

Nerima-Hikarigaoka Hospital, Tokyo (Japan)

23 More presentations in this session

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Doctor Y. Yamauchi (Yokohama, JP)
Abstract
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Doctor M. Giehm-Reese (Aarhus, DK)
Abstract Slides
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Doctor S. Mohanty (Austin, US)
Abstract
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Doctor F. Kece (Leuven, BE)
Abstract
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Doctor M. Kottmaier (Munich, DE)
Abstract

Access the full session

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Poster Session 6 - Atrial fibrillation - ablation

The Event

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ESC Congress 2018

28 August 2018 08:30 CET

ESC 365 is supported by

novartis Explore sponsored resources

ESC 365 is supported by

novartis Explore sponsored resources